Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

JTAG Functional Test(JFT) provides developers with a new method for preparing tests fornon-boundary-scan portions of their boards. JFT simplifies tests ofmixed-signal parts such as ADCs and DACs, ...

Asset InterTech has announced its DFT Analyzer, which according to the company reduces manufacturing and test costs by validating the boundary-scan design-for-test features in a circuit-board design ...

Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...